PROJECT X (Patented Vision Measuring System)
PROJECT X (Patented Vision Measuring System)
Category: ABERLINK Coordinate Measuring Machine (CMM) Series , CMMs and Vision System
Brand: ABERLINK (U.K.)
Specifications
Axis Travel (mm): X 400
Y 300
Z 125
Overall Size (mm): X 583
Y 722
Z 670
Stand Off (mm): 125
Field of View (mm): 10
2D Accuracy: 7.5m
Optimum Temperature Range: 18 - 22°C
Project X finally replaces the old technology of a profile projector. It is easier to use than a profile projector. It is quicker to use than a profile projector and it will
deliver reliable, consistant inspections time after time. Project X is available as either a manual machine or with full CNC control.
Key Features
- High speed optical scanning -up to 5000 points/second
- Fully programmable digital zoom, no need to change lenses
- Powerful edge detection tools for maximum accuracy
- Aberlink’s easy-to-use vision measurement software
Components can be placed on a glass table and remain stationary, whilst the camera is moved around taking measurements above. There is no need to secure the component on the table as there would be on a moving stage machine.
Combine this simple mechanical structure, made possible by the revolutionary scale technology, with the Aberlink measurement software and you will soon understand why Project X is the standard for 2-dimensional measurement.
Technical Information:
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Aberlink Project X Vision System
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